Method and apparatus for suppression of crosstalk and noise in time-division multiplexed interferometric sensor systems

ABSTRACT

Unwanted signal components in time-division multiplexed (TDM) systems may lead to crosstalk and noise if these pulses overlap with signal pulses from an interrogated sensor. The crosstalk and noise are dominated by interference between the signal pulses from the interrogated sensor and the unwanted signal components and can be greatly reduced by suppressing this interference signal. The unwanted signal components may include overlapping pulses originating from different sets of interrogation pulses (repetition periods). Modulating the phase or frequency between the repetition periods so that the unwanted interference signal does not appear at frequencies from which the phase of the interrogated sensor is demodulated suppresses this interference. Other unwanted signal components include leakage light during dark periods of the duty cycle of an interrogation signal. Modulating the phase difference between the interrogation signal and the leakage light suppresses the interference between the leakage light and the interrogation signal.

CROSS-REFERENCE TO RELATED APPLICATIONS

This is a continuation of co-pending U.S. patent application Ser. No.11/866,040 filed Oct. 2, 2007, which is a continuation of 11/056,970filed Feb. 11,2005, now U.S. Pat. No. 7,336,365 issued Feb. 26, 2008,which are herein incorporated by reference.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention generally relates to time division multiplexedinterferometric sensors. More specifically, the present inventionrelates to interrogating interferometric sensors in a manner thatimproves signal-to-noise ratios.

2. Description of the Related Art

An interferometric sensor system may comprise a transmitter unit thatproduces an interrogation signal for the interferometric sensors, asensor network, and a receiver unit that detects the signals from thesensor network. The sensor network may comprise several optical pathwaysfrom its input to its output, and some pairs of optical pathways formsensor interferometers. These optical pathways are called sensorpathways. Each sensor interferometer comprises a sensor and lead paths,the parts of the two sensor pathways that are not common define thesensor, while the common parts define the lead paths. In a fiber opticsensor network the lead paths are called lead fibers. The portion of thelead paths between the transmitter unit and a sensor is called thedown-lead path and the portion of the lead paths between a sensor andthe receiver unit is called the up-lead path. The portion of the leadpaths that are common to both the down-lead path and the up-lead path iscalled the common lead path, or common lead fiber for a fiber opticsensor network. The sensors interferometer can be Michelsoninterferometers, Mach-Zender interferometers or Fabry-Perotinterferometers. The sensor network can be a number of topologies,including a star network, a ladder network, a transmissive serial array,a serial Michelson array or an inline Fabry-Perot sensor array. Thedifferent paths through the sensor network may typically be formed byoptical waveguides and splitters like optical fibers, optical splitters,circulators, and other waveguide coupled components, or free spaceoptical paths, mirrors, beam splitters and other bulk components. Thetime delay difference r, between the two sensor pathways is called theimbalance of that sensor, which is typically equal for all sensors. Thesensor phase, which is the phase delay difference between the two sensorpathways, can be made sensitive to some physical property that one wantsto measure. Thus, information about the physical property can be foundby extracting the phase of the interference between the interrogationsignal that has propagated the two sensor pathways.

Time-division multiplexing (TDM) of an interferometric sensor network isa form of pulsed interrogation that is achieved by producing lightpulses within the transmission unit and transmitting the pulses into thesensor network in one or more pulse transmission time intervals. Inbetween the pulses there may be time intervals without any transmittedlight, which are called dark transmission time intervals. Each pulsetransmission time interval has typically a length similar to theimbalance of the interrogated sensors. The interrogation signal is madeup from a sequence of TDM repetition periods, where each TDM repetitionperiod comprises a sequence of pulse transmission time intervals anddark transmission time intervals. Typically, the TDM repetition periodshave equal length and the delay from the start of the TDM repetitionperiods to the respective pulse and dark transmission time intervals isfixed. A sequence of pulse transmission time intervals that arepositioned equally in consecutive TDM repetition periods is called apulse transmission time slot. Similarly, a sequence of dark transmissiontime intervals positioned equally in consecutive TDM repetition periodsis called a dark transmission time slot. The following description usestransmission time slot as the collective term for pulse transmissiontime slot and dark transmission time slot. The signal of a transmissiontime slot is defined by masking out the interrogation signal during thetime intervals that define the transmission time slot. The phase orfrequency of the optical signal within a transmission time slot istypically varied.

Signals from two pulse transmission time slots are combined at thereceiver unit in a receiver time slot after having propagated the twosensor pathways of a sensor interferometer. The interference signalwithin this receiver time slot includes information about the sensorphase. One or more receiver time slots are associated with the sensor,and the optical signal in at least one receiver time slot is detected,sampled with a sample rate that is equal to or an integer fraction ofthe TDM repetition rate and processed to extract a demodulated sensorphase as a measure for the sensor. The bandwidth of the demodulatedsensor phase signal is less than the receiver Nyquist bandwidth, whichis half the sampling rate. Any component of the sensor phase signalabove the receiver Nyquist bandwidth is aliased. Thus, the TDMrepetition period must therefore be chosen so that aliasing of thesensor phase signal is avoided. TDM of several sensors is typicallyachieved by having a different delay from the transmission unit to thereceiver unit for each of the sensors so that different sensors areassociated with different receiver time slots. A receiver time slot mayalso include information about the sensor phase of more than one sensor,and a set of receiver time slots can be processed to extract informationabout the individual sensors, as disclosed in O. H. Waagaard, “Methodand Apparatus for Reducing Crosstalk Interference in an InlineFabry-Perot Sensor Array,” U.S. patent application Ser. No. 10/649,588,which is herein incorporated by reference.

A well-known time division multiplexed interrogation technique is thetwo pulse heterodyne sub-carrier generation technique as disclosed in J.P. Dakin, “An Optical Sensing System,” U.K. patent application number2,126,820A (filed Jul. 17, 1982). The two pulse heterodyne techniquerepeatedly transmits two interrogation pulses in two pulse transmissiontime slots. The phase difference between the first and the second pulsefrom a TDM period to the next is linearly varied with time to produce adifferential frequency shift between the two pulse transmission timeslots. The signal from the two pulse transmission time slots that haspropagated the two sensor pathways interferes within a receiver timeslot. The interference signal comprises a component at a sub-carrierfrequency equal to the differential frequency shift. The phase of thissub-carrier provides a measure for the sensor phase.

A well-known interrogation method for continuous wave (cw) interrogationof interferometric sensors is the phase generated carrier technique,disclosed in A. Dandridge et al., “Homodyne Demodulation Scheme forFiber Optic Sensors Using Phase Generated Carrier,” IEEE Journal ofQuantum Electronics, 18(10): 1647-1653, 1982. The phase generatedcarrier technique is based on a harmonic bias modulation of the phase ofthe interference signal, for instance, by modulation of the sourcephase, resulting in a detected interference signal that has signalcomponents at harmonics of the source modulation frequency. The sensorphase can be determined from a combination of the signal components ofseveral harmonics of the source modulation frequency. This technique canalso be used in combination with time-division multiplexing, see A. D.Kersey et al., “Time-division Multiplexing of Interferometric FiberSensor Using Passive Phase-generated Carrier Interrogation,” OpticsLetters, 12(10): 775-777, 1987. The light source may then be pulsed inthe same manner as for the two pulse heterodyne sub-carrier generationtechnique, while the source phase is modulated in the same manner as forthe cw phase generated carrier technique. The detector is sampled at thearrival of the reflected pulses, and the sensor phase is calculated fromthe harmonics of the source modulation frequency.

With one interrogation method specially suited for interrogation ofFabry-Perot sensors, a multiple of interrogation pulses (larger thantwo) are generated within three or more pulse transmission time slots,see O. H. Waagaard and E. Rønnekleiv, “Multi-pulse HeterodyneSub-carrier Interrogation of Interferometric Sensors,” U.S. patentapplication Ser. No. 10/862,123, which is herein incorporated byreference. The phases of the different pulse transmission time slots aremodulated at different linear rates. This method improves thesignal-to-noise ratio because the multiple reflections generated withinthe Fabry-Perot cavity do not have to fade out between each pair ofinterrogation pulses as would be the case for two-pulse interrogationmethods.

Unwanted light components that have propagated through other opticalpathways from the transmitter unit to the receiver unit other than thetwo sensor pathways may lead to noise in the demodulated sensor phase orcrosstalk from other sensors if these light components overlap with thesensor interference signal within the receiver time slots. For eachinterrogated sensor, the noise contributing pathways are define as allthese optical pathways from the transmitter unit to the receiver unitapart from sensor pathways. Since the light components that havepropagated through a noise contributing pathway have significantly loweramplitude than the light components that have propagated through thesensor pathways, the noise and crosstalk caused by these unwanted lightcomponents can be significantly reduced if the interference between theunwanted light components and the interference signal from theinterrogated sensor can be suppressed.

A noise contributing pathways may arise due to discrete reflectors suchas reflectors of other sensors, circulators, couplers, connectors, etc.,or due to distributed reflectors such as Rayleigh scattering. If TDM iscombined with wavelength division multiplexing (WDM), wavelengthselective components such as fiber Bragg gratings (FBGs) orWDM-splitters have limited sideband suppression. Thus, the interrogationsignal within a certain WDM-channel may propagate optical pathwaysbelonging to a sensor of a different WDM-channel. The delay of a noisecontributing pathway may be such that a pulse that has propagated thenoise contributing pathway is received by the receiver unit within areceiver time slot that is used to demodulate the sensor phase. This isthe case if the difference in delay between the noise contributingpathway and one of the sensor pathways is equal to the delay between twopulse transmission time intervals. If the common lead path to the sensoris longer than the TDM repetition period, such noise contributingpathways may arise due to Rayleigh reflection along the common leadpath. The points along the common lead path that give rise to such noisecontributing pathways are called collision points.

A noise contributing pathway can also be a sensor pathway of othertime-division multiplexed sensors within the same WDM-channel. If thereis no light within the dark transmission time slots, these pathways donot contribute with noise and crosstalk on the interrogated sensor sincethe optical signal from another time-division multiplexed sensor appearsin another receiver time slot. However, limited on/off extinction of theinterrogation pulses, for instance, due to light leakage during the darktransmission time slots, may give rise to other light components thatmay interfere with the interference signal of the interrogated sensor.Such unwanted interference may also lead to unwanted demodulated noiseand crosstalk. One proposed method for suppression of this interferenceincludes applying a large phase generated carrier modulation withfrequency f_(pgc) to a lithium niobate phase modulator during the darktransmission time slots, and thereby moving the signal components due tointerference between one of the pulses and leakage light to multiples off_(pgc), see D. Hall and J. Bunn, “Noise Suppression Apparatus andMethod for Time Division Multiplexed Fiber Optic Sensor Arrays,” U.S.Pat. No. 5,917,597, 1999. However, the amount of suppression of thisinterference depends on the time delay between the generated pulse andthe leakage light, and there is no suppression when the time delay is1/f_(pgc). Also, a very large voltage signal has to be applied to thephase modulator, which makes this method impractical.

Therefore, there exists a need in the art for a method that reduces thesensitivity to the interference with unwanted light components reflectedfrom other parts of a TDM sensor network than the interrogated sensor.

SUMMARY OF THE INVENTION

Embodiments of the invention generally relate to reducing crosstalk andnoise in time-division multiplexed (TDM) systems by suppressinginterference signals from unwanted light components that have propagatednoise contributing pathways through the sensor network. The unwantedlight components may lead to crosstalk and noise if they overlap in timewith an optical signal received from an interrogated sensor. Noise andcrosstalk are contributed from interference at the receiver unit betweenoptical signals received from the interrogated sensor and unwanted lightpulses that have propagated noise contributing pathways. Othercontributions may come from interference between signals received fromthe interrogated sensor and leakage light that has propagated pathwaysof other time-division multiplexed sensors or other pathways withmoderate transmission loss. Noise and crosstalk due to the unwantedinterference between the optical signal from the sensor and unwantedlight components can be suppressed by modulating the optical phase inthe transmission time slots in such a way that the unwanted interferencesignals are distributed to frequency bands that do not affect thedemodulated sensor signal.

In one embodiment of the invention, the optical phase of thetransmission time slots is modulated in such a way that unwantedinterference between the signal of a pulse transmission slot and adelayed signal of the same or another pulse transmission time slot or adark transmission time slot is shifted in frequency such that theunwanted interference signal appears outside the frequency bands usedfor demodulation of the sensor. This allows for suppression of noise andcrosstalk from noise contributing pathways that have a delay thatdiffers with several TDM repetition periods from the delay of the sensorpathways, and a largest possible frequency separation between an opticalsignal from the interrogated sensor and the unwanted interferencesignal.

The modulation of the optical phase of the transmission time slots canbe divided into a low frequency range and a high frequency range. In thelow frequency range, the applied phase modulation is essentially equalwithin a single transmission time interval but changed from one TDMperiod to the next. The unwanted interference signal is shifted by afrequency smaller than the TDM repetition frequency but away from thefrequency bands used for demodulation of the sensor so that the unwantedinterference signal can be suppressed by a digital filter after samplingthe signal within the receiver time slot. In order to suppress unwantedinterference between the optical signal from the interrogated sensor andunwanted light pulses, the optical phase of the pulse transmission timeslots is modulated with a phase function that varies quadratically withtime. Suppression of unwanted interference between the optical signalfrom the interrogated sensor and leakage light is achieved by having afrequency shift between the pulse transmission time slots and the darktransmission time slots that is outside the frequency bands used fordemodulation of the sensor.

In the high frequency range, the frequency of transmission time slots isshifted from one TDM period to the next by more than the receiverbandwidth of the receiver unit. The frequency of the interferencebetween the optical signal from the sensor and the unwanted lightcomponents becomes larger than the receiver bandwidth and can thereforebe suppressed by an analog receiver filter.

BRIEF DESCRIPTION OF THE DRAWINGS

So that the manner in which the above recited features of the presentinvention can be understood in detail, a more particular description ofthe invention, briefly summarized above, may be had by reference toembodiments, some of which are illustrated in the appended drawings. Itis to be noted, however, that the appended drawings illustrate onlytypical embodiments of this invention and are therefore not to beconsidered limiting of its scope, for the invention may admit to otherequally effective embodiments.

FIG. 1 illustrates schematically a time-division multiplexed (TDM)sensor system with Fabry-Perot sensors that incorporate the principlesof the invention.

FIG. 1A shows schematically use of frequency modulation in a Fabry-Perotsensor array.

FIG. 2 illustrates an interrogation signal used with two pulseheterodyne sub-carrier generation.

FIG. 3 illustrates reflection of TDM interrogation pulses from a sensorwith two reflectors R₁ and R₂ and an unwanted reflectors R_(x).

FIG. 4 illustrates collision points along a common lead fiber wherespurious reflectors may give rise to unwanted interference signals at adetector.

FIG. 5 shows a frequency axis where frequencies of signals due tointerference between signal pulses from an interrogated sensor andunwanted pulses appear in a hatched part of the frequency axis that isfiltered in order suppress crosstalk and noise.

FIG. 6 illustrates frequency shifts having f_(step)>RBW applied tointerrogation signals to suppress interference between reflections ofinterrogation pulses originating from different TDM-periods and aninterrogation pulse and reflected leakage light.

FIG. 7 shows generated beat frequencies formed by interference between areflection from a collision point and a reflection from a sensor wherethe collision points are at distances of kT·2n/c, k=1, . . . , 16 awayfrom the sensor.

DETAILED DESCRIPTION

FIG. 1 illustrates a fiber-optic time-division multiplexing (TDM)interferometric sensor system 100 that incorporates the principles ofthe present invention. The system 100 includes an array 114 ofFabry-Perot sensors 116, a transmitter unit 130 that produces aninterrogation signal for the sensor array 114 and a receiver unit 132that receives and demodulates the signals from the sensors. Thetransmitter unit 130 includes a laser 102, a switch 104, and a phasemodulator 106, while the receiver unit 132 comprises a detector 110, areceiver filter 111 that suppresses frequency components in the detectedoptical signal that are outside the band required for demodulation ofthe sensors, a sample-and-hold circuit 126, an analog to digital (A/D)converter 128 and a demodulation unit 112 that extracts the phase of theindividual sensors 116. The Fabry-Perot sensors 116 a and 116 b areindividually formed on optical fibers 120 a and 120 b that are coupledtogether by a splitter 122 forming a star network topology. A fiber 124b is connected to a circulator 108 which separates a lead fiber intodown-lead fibers 124 a and up-lead fibers 124 c such that the fibers 124a-c optically couple together elements of the system 100. The fibers 124a, 124 b and 124 c are connected to the circulator so that theinterrogation signal from the transmission unit 130 is directed towardsthe sensor array 114 and so the reflected signal from the sensor arrayis directed towards the receiver unit 132. A common lead fiber of sensor116 a (116 b) is formed by the fiber 124 b and the portion of the fiber120 a (120 b) between the coupler 122 and the sensor. Accordingly, anoise contributing fiber for the two sensors 116 a and 116 b are formedby the fibers 124 b, 120 a and 120 b.

While FIG. 1 illustrates the use of the laser 102 and the phasemodulator 106, the principles of the present invention can beimplemented as shown in FIG. 1A. FIG. 1A shows a transmitter unit 130with a frequency shifter 150, such as a Bragg cell, which sweeps thefrequency of the light from the laser 102. Additionally, while FIGS. 1and 1A show interrogation of Fabry-Perot type interferometers,principles of the invention are highly suited for interrogation of otherinterferometer types, such as, for example, Michelson and Mach-Zenderbased interferometer topologies.

FIG. 2 shows aspects of TDM where the laser 102 outputs light with aperiodic intensity pattern and with a repetition period T called a TDMrepetition period. The TDM repetition period is divided intotransmission time slots of a length equal to the sensor delay imbalanceτ_(s). A sequence of two or more interrogation pulses are generated intwo or more transmission time slots by switching on and off the laser102 directly or by using the switch 104. For the illustrated embodiment,the repetition period is divided into five transmission time slots,where time slots one and two are pulse transmission time slots whilethree, four and five are dark transmission time slots.

The signal of a certain transmission time slot is formed by masking outthe portion of the interrogation signal within the transmission timeslot. This is done by multiplying the interrogation signal with a signalthat is one during the transmission time slot and zero in all other timeslot. The duty-cycle of the laser 102 is defined as the fraction of timein which the laser 102 is turned on. The duty-cycle depends on thenumber of the sensors 116 multiplexed and the separation between thesensors 116. Pulses propagating a sensor path and a reference path ofone of the sensors 116 interfere at the receiver producing optical poweramplitudes that depend periodically on the phase delay differencebetween the two paths. The phase delay varies due to a response from ameasurand.

FIG. 3 shows an unwanted reflector R_(x) and first and second reflectorsR₁ and R₂ of the sensor 116 being interrogated. The overlapping pulsesreflected from the reflectors R₁ and R₂ are reflections of interrogationpulses transmitted in the same TDM repetition period, while the pulsesreflected from the unwanted reflector R_(x) are reflections ofinterrogation pulses transmitted in another TDM repetition period. Whenthe dual-pass delay r between the unwanted reflector R_(x) and one ofthe reflectors R₁ or R₂ is equal to a multiple of the TDM repetitionperiod T, pulses reflected from the unwanted reflector R_(x) and thesensor 116 overlap in time at the receiver and the interference betweenthe reflection from the sensor 116 and the unwanted reflector R_(x) maygive rise to noise or crosstalk on the demodulated signal from thesensor 116. Accordingly, unwanted reflectors positioned both before andafter the sensor 116 may give rise to noise and crosstalk on the sensor.

FIG. 4 shows that reflections in the common lead fiber 124 b leading tointerference between pulses originating from different TDM repetitionperiods appear at positions where the interrogation pulses propagatingtowards the sensors 116 collide with the reflected signal from thesensors 116. Weak reflections in the up-lead fiber 124 a and down-leadfiber 124 c to a first order approximation do not contribute to noise orerrors in the detected and demodulated signals. The parts of the commonlead fiber 124 b where the pulses collide define collision points 404.Although not shown in the figure, there are also collision points onfibers 120 a and 120 b. The distance between the collision points 404 isdefined as c/(2n)·T, where c is the speed of light and n is therefractive index of the fiber. This means that the total number ofcollision points 404 per sensor reflector on the common lead fiber 124 bis k_(max)=└T_(f)/T┘, where T_(f) is the maximum difference in delaybetween a sensor pathway and a noise contributing pathway. Here, -537 .┘denotes rounding down to the nearest integer. Thus, suppression of theinterference only requires suppressing the interference between thereflections from two interrogation pulses that are less than or equal tok_(max) TDM repetition periods apart.

For a larger than the pulse coherence time, the pulses reflected fromthe unwanted reflector R_(x) do not originate from the same repetitionperiod as the reflectors R₁ and R₂. This allows for suppression ofcrosstalk and noise by modulation of the phase or frequency of theinterrogation pulses from TDM repetition period to TDM repetition periodso that the interference between the pulses from the interrogated sensor116 and the unwanted pulses does not include frequency components thatare used to demodulate the sensor 116. By modulating the phase of theinterrogation signal, the interference between the signal transmitted inone pulse time slot and the signal transmitted in the same or anotherpulse time slot delayed by more than the sensor imbalance provides afrequency outside the frequency bands used for demodulation of thesensors 116. Furthermore, modulating the phase of the interrogationsignal so that the interference between the signal transmitted in onepulse time slot and any signal transmitted in the dark time slotsprovides a frequency outside the frequency bands used for demodulationof the sensors 116 and thus enables suppression of noise due to leakageduring the dark time slots.

The following embodiments described assume that a variant of the twopulse heterodyne sub-carrier generation is used. However, otherembodiments can also be used with other interrogation schemes such asphase-generated carrier interrogation and multi-pulse heterodynesub-carrier interrogation.

In one embodiment, the phase difference between the two interrogationpulses in the pulse time slots is varied linearly with time so that thesensor phase can be found from the sequence of reflected pulses from thesensor 116 by processing information within a frequency band centered atthe sub-carrier frequency f_(sc) and with a bandwidth 2BW. The noise orcrosstalk due to the interference between an unwanted light componentand a pulse from an interrogated sensor is suppressed if the phase orfrequency modulation of the interrogation pulses is such that theinterference does not appear in the frequency bandf_(sc)−BW≦f≦f_(sc)+BW. Signal components outside this frequency band canbe removed either by the analog receiver filter 111 (shown in FIG. 1) ora digital filter within the demodulation unit 112.

In some applications, the interrogation signal may be divided intodifferent channels that are interleaved in the time domain so that thesampling period T_(s) of each channel is a multiple of the TDMrepetition period T. One example of such interleaving is thepolarization-resolved interrogation method based on switching thepolarization states of the interrogation pulses described in O. H.Waagaard and E. Rønnekleiv, “Method and Apparatus for ProvidingPolarization Insensitive Signal Processing for Interferometric Sensors,”U.S. patent application Ser. No. 10/650,117, which is hereinincorporated by reference. In this example, the repetition periods aredivided into four polarization channels that are defined by thepolarization states of the two interrogation pulses. The polarizationchannels are sequentially interrogated so that within P=4 repetitionperiods all polarization channels are interrogated. In general, therepetition periods may be divided into P≧1 interleaved channels, where Pis an integer. The sampling period for each interleaved channel becomesT_(s)=PT.

The allowed frequencies range can be divided into a low-frequency(f<RBW) range and a high-frequency range (f>RBW), where RBW is thebandwidth of the receiver filter 111, which must be larger than1/(2τ_(s)) in order to detect the individual pulses.

In one embodiment of the invention where the unwanted interferencesignal is shifted to the high-frequency range, the optical frequency isshifted from repetition period to repetition period so that thedifference in frequency between any two pulses in k_(max) subsequent TDMrepetition periods is larger than RBW. FIG. 6 shows how theinterrogation signal can be shifted in frequency in steps that arelarger than RBW. Interference between reflected interrogation pulsesoriginating from different repetition periods produce frequencies largerthan RBW. The receiver filter removes these interference signals. Therequired frequency modulation can be achieved by modulation of the phaseusing an electro-optical modulator 106 as shown in FIG. 1, by using afrequency shifter such as an acousto-optical modulator 150 as shown inFIG. 1A, or by tuning the frequency of the light source. The frequencyshift is reset to f_(step) after minimum k_(max) repetition periods.

In FIG. 6, the optical frequency shift of leakage light that may occurin the time intervals when the intensity nominally should be zero iskept at zero, and it is therefore different from the frequency of any ofthe interrogation pulses. This means that the interference betweenreflected leakage light and reflected interrogation pulses is alsosuppressed since the frequency difference is larger than RBW.

In another embodiment, the unwanted interference signal is shifted tothe low-frequency range by varying the optical phase of theinterrogation pulses from repetition period to repetition period in sucha manner that the interference between pulses reflected from theinterrogated sensor and unwanted pulse reflections is shifted to afrequency that is outside the frequency band f_(sc)±BW that is used forthe demodulation. The available frequency range to where the unwantedinterference signal components can be shifted is limited by the samplingperiod of the individual sampling channels, T_(s)=PT, and the bandwidthBW of the signal from the interrogated sensor. All frequency componentslarger than the receiver Nyquist frequency 1/(2T_(s)) are aliased to thefrequency in the range below 1/(2T_(s)) due to the sampled nature of thepulses and the receiver sampling. Crosstalk and noise caused byinterference between pulses reflected from an interrogated sensor andpulses reflected from an unwanted reflector are therefore suppressed ifthe phase modulation between repetition periods is such that theunwanted interference signals do not appear at frequencies f in theranges

$\begin{matrix}{{{\frac{k}{T_{s}} - f_{sc} - {B\; W}} \leq f \leq {\frac{k}{T_{s}} - f_{sc} + {B\; W}}}{{{\frac{k}{T_{s}} + f_{sc} - {B\; W}} \leq f \leq {\frac{k}{T_{s}} + f_{sc} + {B\; W}}},}} & (1)\end{matrix}$

where k is an integer larger than or equal to zero. These bands are thenon-hashed parts of the frequency axis in FIG. 5.

The n'th repetition period in a TDM sampling sequence corresponds to them'th point in the sampling sequence of the p'th (p=0, . . . , P−1)sampling (interleaved) channel so that n=Pm+p. The phase of theinterrogation pulses in the first and second transmission time slot are

Φ_(l)(n)=Φ_(l) ^(p)(m)=Φ_(ns)(n)−(2−μ)Φ_(sc)(n)  (2a)

Φ₂(n)=Φ₂ ^(p)(m)=Φ_(ns)(n)+μΦ_(sc)(n),  (2b)

respectively, where 0≧p≧2 is a constant, Φ_(ns) is the modulation thatprovides noise suppression from unwanted reflections and Φ_(sc) is themodulation that provides the sub-carrier, and they are given by

Φ_(ns)(n)=Φ_(ns) ^(p)(m)=n ² πf ₁T=(Pm+p)πf ₁ T  (3a)

Φ_(sc)(n)=Φ_(sc) ^(p)(m)=mπf _(sc) T _(s)+Φ₀ ^(p)/2.  (3b)

The phase difference between the two transmission time slots is Φ₂^(p)(m)−Φ₁ ^(p)(m)=2Φ_(sc) ^(p)(m)=m2πf_(sc)T_(s)+Φ₀ ^(p). The freedomto choose μ in Equations (2a) and (2b) enables selection so that thesub-carrier modulation is either on the first pulse (μ=0), on the secondpulse (μ=2) or both (μ=1). Selection of the frequency f₁ is discussedbelow. If the phase offset of the interleaved channels are chosen as Φ₀^(p)=p2πf_(sc)T, then Φ_(sc)(n)=nπf_(sc)T, and the phase differencebetween the two transmission time slots varies linearly with n. Thephase offset Φ₀ ^(p) may be removed from the demodulated phase signal bysubtraction. In the following discussions, it is assumed Φ₀ ^(p)=0, sothat Φ_(sc) ^(p)(m)=Φ_(sc)(m), ∀p.

The interference between reflectors R₁ and R₂ in interleaved channel pis given by

$\begin{matrix}{{I^{p}(m)} = {{R_{1}I_{2}} + {R_{2}I_{1}} + {2\; {V^{p}(m)}\sqrt{R_{1}R_{2}I_{1}I_{2}}{\cos \left( {{m\; 2\; \pi \; f_{sc}T_{s}} + {\varphi_{s}^{p}(m)}} \right)}}}} & (4)\end{matrix}$

where I₁ and I₂ are the intensities of the two interrogation pulse,V^(p)(m) is the visibility of the interference and Φ_(s) ^(p)(m) is thesensor phase. The complex reflection response of interleaved channelp,X_(p)(m)=r_(p)(m)exp[iΦ_(s) ^(p)(m)], where r_(p)(m)=2V^(p)(m)√{squareroot over (R₁R₂I₁I₂)}, can be found from the sequence of detected pulsesfrom a sub-carrier with frequency f_(sc). From the P complex valuesX_(p)(m), p=0, . . . , P−1, the sensor phase can be calculated.

The dual-pass delay between the reflectors R₁ and R_(x) is one TDMrepetition period in FIG. 3. In order to analyze the interferencebetween the reflections from R₁, R₂ and R_(x) in a more general case,the dual-pass delay difference between the reflectors R₁ and R_(x) isset to k=Pj+q (q=0, 1, . . . P−1) times the TDM repetition period. Notethat the following discussion applies when the dual-pass delaydifference differs with less than the pulse coherence length from ktimes the TDM repetition period. Pulses reflected from R_(x) appear inthe same receiver time slot as the interference signal from the sensor.There are two unwanted interference components within this receiver timeslot caused by interference with reflections from the unwanted reflectorR_(x). The first component is caused by the interference between pulsesoriginating from the second pulse transmission time slot reflected fromthe first reflector R₁ and pulses originating from the same pulsetransmission time slot reflected from the unwanted reflector R_(x) anddelayed by k TDM repetition periods. The second component is theinterference between pulses originating from the first pulsetransmission time slot reflected from the second reflector R₂ and pulsesoriginating from the second pulse transmission time slot and delayed byk TDM repetition periods reflected from the unwanted reflector R_(x).The interference phase of these two components can be expressed as,

$\begin{matrix}{{{\varphi_{2}^{p}(m)} - {\varphi_{2}^{p - q}\left( {m - j} \right)} + {\varphi_{x}^{p}(m)} + {\varphi_{s}^{p}(m)}} = {{{\varphi_{ns}(n)} - {\varphi_{ns}\left( {n - k} \right)} + {\mu \; {\varphi_{sc}(m)}} - {\mu \; {\varphi_{sc}\left( {m - j} \right)}} + {\varphi_{x}^{p}(m)} + {\varphi_{s}^{p}(m)}} = {{{\left\lbrack {n^{2} - \left( {n - k} \right)^{2}} \right\rbrack \pi \; f_{1}T} + {{\mu \left\lbrack {m - \left( {m - j} \right)} \right\rbrack}\pi \; f_{sc}T_{s}} + {\varphi_{x}^{p}(m)} + {\varphi_{s}^{p}(m)}} = {{{mk}\; 2\; \pi \; f_{1}T_{s}} + {\varphi_{x}^{p}(m)} + {\varphi_{s}^{p}(m)} - \alpha_{k}^{p} + {\mu \; \beta_{j}}}}}} & \left( {5\; a} \right) \\{{{\varphi_{1}^{p}(m)} - {\varphi_{2}^{p - q}\left( {m - j} \right)} + {\varphi_{x}^{p}(m)}} = {{{\varphi_{ns}(n)} - {\varphi_{ns}\left( {n - k} \right)} - {\left( {2 - \mu} \right){\varphi_{sc}(m)}} - {\mu \; {\varphi_{sc}\left( {m - j} \right)}} + {\varphi_{x}^{p}(m)}} = {{{\left\lbrack {n^{2} - \left( {n - k} \right)^{2}} \right\rbrack \pi \; f_{1}T} + {\left\lbrack {{{- \left( {2 - \mu} \right)}m} - {\mu \left( {m - j} \right)}} \right\rbrack \pi \; f_{sc}T_{s}} + {\varphi_{x}^{p}(m)}} = {{{mk}\; 2\; \pi \; f_{1}T_{s}} - {m\; 2\; \pi \; f_{sc}T_{s}} + {\varphi_{x}^{p}(m)} - \alpha_{k}^{p} + {\mu \; {\beta_{j}.}}}}}} & \left( {5\; b} \right)\end{matrix}$

Here, α_(k) ^(p)=k(k +2p)πf₁T, β_(j)=jπf_(sc)T_(s), and Φ_(x) ^(p)(m) isthe phase delay difference between the second reflector R₂ and theunwanted reflector R_(x)·Φ_(x) ^(p)(m) is assumed to be slowly varyingcomparable to the receiver Nyquist frequency. Thus, the interferencecomponents in (5a) and (5b) are confined to frequency bands centeredaround kf₁ and f_(sc)−kf₁.

While not shown in the figures, noise and crosstalk can also appear ifthe dual-pass delay between the second reflector R₂ and the unwantedreflector R_(x) is equal to k=Pj+q (q=0, 1, . . . P−1) times the TDMrepetition period. In this case, the signal from the sensor includes theinterference between pulses originating from the second pulsetransmission time slot reflected from the first reflector R₁ and pulsesoriginating from the first pulse transmission time slot reflected fromthe unwanted reflector R_(x) and the interference between pulsesoriginating from the first pulse transmission time slot reflected fromthe second reflector R₂ and pulses originating from the first pulsetransmission time slot reflected from the unwanted reflector R_(x). Thephase of these two interference components is given as,

$\begin{matrix}{{{\varphi_{2}^{p}(m)} - {\varphi_{1}^{p - q}\left( {m - j} \right)} + {\varphi_{x}^{p}(m)} + {\varphi_{s}^{p}(m)}} = {{{\varphi_{ns}(n)} - {\varphi_{ns}\left( {n - k} \right)} + {\mu \; {\varphi_{sc}(m)}} + {\left( {2 - \mu} \right){\varphi_{sc}\left( {m - j} \right)}} + {\varphi_{x}^{p}(m)} + {\varphi_{s}^{p}(m)}} = {{{\left\lbrack {n^{2} - \left( {n - k} \right)^{2}} \right\rbrack \pi \; f_{1}T} + {\left\lbrack {{\mu \; m} + {\left( {2 - \mu} \right)\left( {m - j} \right)}} \right\rbrack \pi \; f_{sc}T_{s}} + {\varphi_{x}^{p}(m)} + {\varphi_{s}^{p}(m)}} = {{{mk}\; 2\; \pi \; f_{1}T_{s}} + {m\; 2\; \pi \; f_{sc}T_{s}} + \; {\varphi_{x}^{p}(m)} + {\varphi_{s}^{p}(m)} - \alpha_{x}^{p} - {\left( {2 - \mu} \right)\beta_{j}}}}}} & \left( {6\; a} \right) \\{{{\varphi_{1}^{p}(m)} - {\varphi_{1}^{p - q}\left( {m - j} \right)} + {\varphi_{x}^{p}(m)}} = {{{\varphi_{ns}(n)} - {\varphi_{ns}\left( {n - k} \right)} - {\left( {2 - \mu} \right){\varphi_{sc}(m)}} + {\mu \; {\varphi_{sc}\left( {m - j} \right)}} + {\varphi_{x}^{p}(m)}} = {{{\left\lbrack {n^{2} - \left( {n - k} \right)^{2}} \right\rbrack \pi \; f_{1}T} + {{\left( {2 - \mu} \right)\left\lbrack {{- m} + \left( {m - j} \right)} \right\rbrack}2\; \pi \; f_{sc}T_{s}} + {\varphi_{x}^{p}(m)}} = {{{mk}\; 2\; \pi \; f_{1}T_{s}} + {\varphi_{x}^{p}(m)} - \alpha_{k}^{p} - {\left( {2 - \mu} \right){\beta_{j}.}}}}}} & \left( {6\; b} \right)\end{matrix}$

In this case, the two interference components are confined to frequencybands centered around kf₁ and f_(sc)+kf₁.

The two collision points with delays that differ by k times the TDMrepetition period from the delays of R₁ and R₂ give rise to componentsin the detected signal at beat frequencies kf₁, f_(sc)−kf₁ andf_(sc)+kf₁. Beat frequencies that are larger than 1/(2T,) are aliased.In a preferred embodiment, the subcarrier frequency is chosen asf_(sc)=1/(N_(p)T_(s)), where N_(p) is an integer larger than 2. Afteraliasing to the Nyquist frequency range [0, 1/(2T_(s))], the beat signalfrequencies become,

f _(a)(k)=|mod(kf ₁ +N _(p) f _(sc)/2, N _(p) f _(sc))−N _(p) f_(sc)/2)|  (7a)

f _(b)(k)=|mod(f _(sc) −kf ₁ +N _(p) f _(sc)/2, N _(p) f _(sc))−N _(p) f_(sc)/2)|  (7b)

f _(c)(k)=|mod(f _(sc) +kf ₁ +N _(p) f _(sc)/2, N _(p) f _(sc))−N _(p) f_(sc)/2)|  (7c)

f₁ should be chosen such that neither f_(a)(k), f_(b)(k) nor f_(c)(k),k=1, 2, . . . k_(max) appears in the frequency range between f_(sc)−BWand f_(sc)+BW. The separation between f_(sc) and the beat frequency thatis closest to f_(sc) is defined as f_(sep). In general, f_(sep) shouldbe as large as possible to avoid overlap between the beat signal bandand the subcarrier band. The choice of frequency f₁ that gives thelargest possible value for f_(sep) is found by settingf_(a)(k_(max)+1)=f_(sc) in Equation (7a). This equation has solutionsf₁=lf_(sep) where l≦k_(max) is an integer that has no common divisorwith k_(max)+1, and

$\begin{matrix}{f_{sep} = {\frac{f_{sc}}{k_{\max} + 1} = {\left\lbrack {\left( {k_{\max} + 1} \right)N_{p}T_{s}} \right\rbrack^{- 1}.}}} & (8)\end{matrix}$

Accordingly, f_(sep) is maximum if N_(p) is as small as possible, i.e.,N_(p)=3 should be chosen.

FIG. 7 shows generated beat frequencies due to interference between thereflection from the collision points and the reflection from the sensorwith k_(max)=16 and N_(p)=3. With l=1, the frequencies that are closestto f_(sc) are f_(b)(1) , f_(c)(1), f_(b)(k_(max)) and f_(c)(k_(max)). Insome cases, it might be preferable to move f_(b)(1) and f_(c)(1) furtheraway from f_(sc). This is achieved by selecting l>1.

The interference between the leakage light reflected from anothertime-division multiplexed sensor and reflection of the interrogationpulses from the interrogated sensor can also be suppressed by modulatingthe difference between the phase of the pulse transmission time slotsand the phase of the dark transmission time slots, Φ_(off). By settingΦ_(off)(n)=Φ_(ns)(n) and using Equation (2), the phase of theinterference between the first or second pulse generated in TDMrepetition period n, respectively, and the leakage light generated inTDM repetition n−k may be expressed as

$\begin{matrix}{{{\varphi_{1}(n)} - {\varphi_{off}\left( {n - k} \right)} + {\varphi_{x\; 1}(n)}} = {{{\varphi_{ns}(n)} - {\varphi_{ns}\left( {n - k} \right)} - {\left( {2 - \mu} \right){\varphi_{sc}(n)}} + {\varphi_{x\; 1}(n)}} = {{{mk}\; 2\; \pi \; f_{1}T_{s}} - {\left( {2 - \mu} \right)m\; \pi \; f_{sc}T_{s}} + {\varphi_{x\; 1}(n)} + \alpha_{k}^{p}}}} & \left( {9\; a} \right) \\{{{\varphi_{2}(n)} - {\varphi_{off}\left( {n - k} \right)} + {\varphi_{x\; 2}(n)}} = {{{\varphi_{ns}(n)} - {\varphi_{ns}\left( {n - k} \right)} + {\mu \; {\varphi_{sc}(n)}} + {\varphi_{x\; 2}(n)}} = {{{mk}\; 2\; \pi \; f_{1}T_{s}} + {\mu \; m\; \pi \; f_{sc}T_{s}} + {\varphi_{x\; 2}(n)} + \alpha_{k}^{p}}}} & \left( {9\; b} \right)\end{matrix}$

where Φ_(x1)(n) and Φ_(x2)(n) are the physical phase difference betweenthe interfering components and α_(k) ^(p) is the same as in Equations(5a) and (5b). It is possible to choose μ and f₁ so that theinterference between signals received from the interrogated sensor andleakage light that has propagated pathways of other time-divisionmultiplexed sensors or other pathways with moderate transmission lossappears at a frequency different from the sub-carrier frequency f_(sc).In most cases the difference in delay between the time-divisionmultiplexed sensors is less than the TDM repetition period. Theinterference between the leakage light and the interrogation pulses fromthe same TDM period (k=0) appears at a frequencies μf_(sc) and(2−μ)f_(sc) which is different from f_(sc) when μ is different from 0 or2. Note that the interference between interrogation pulses and leakagelight can be suppressed also when Φ_(off)(n)=Φ_(ns)(n)=0, i.e., nomodulation is applied to suppress interference between pulsesoriginating from different TDM repetition periods. In a preferredembodiment, μ=1 may be chosen so that

Φ₁(n)=Φ_(ns)(n)−Φ_(sc)(n)  (10a)

Φ₂(n)=Φ_(ns)(n)+Φ_(sc)(n)  (10b)

Then, the interference between the leakage and the interrogation pulsesfrom the same TDM repetition period appears at half the sub-carrierfrequency. If f_(sc)>4 BW, the interference between the interferencepulses and the leakage light does not give any contribution in thesignal band from which the sensor phase is extracted, and can thereforebe filtered out by any appropriate digital filter.

With the phase modulation scheme described in Equations (9) and (10),Φ_(sc) must be modulated two sub-carrier periods before the phase can bereset. This means that the maximum voltage applied to the phasemodulator is twice the maximum voltage when the crosstalk due to leakageis not suppressed. However, Φ_(sc) can be reset every sub-carrier periodif a square wave pattern with period that is half the sub-carrier periodand amplitude π/2 to is added to Φ_(off):

$\begin{matrix}{{{\varphi_{off}(n)} = {{\varphi_{ns}(n)} + {\frac{\pi}{2}{{rect}\left( \frac{n}{2\; {PN}_{p}} \right)}}}},{where}} & (11) \\{{{rect}(x)} = \left\{ \begin{matrix}1 & {{x - \left\lfloor x \right\rfloor} < 0.5} \\{- 1} & {{otherwise}.}\end{matrix} \right.} & (12)\end{matrix}$

Thus, the reset of Φ_(sc)(n) is compensated by a phase shift of π inΦ_(off), leading to an interference signal between the leakage light andone of the two pulses that are periodic with half the sub-carrierperiod.

While the foregoing is directed to embodiments of the present invention,other and further embodiments of the invention may be devised withoutdeparting from the basic scope thereof, and the scope thereof isdetermined by the claims that follow.

1. An interferometric sensor system, comprising: an optical networkhaving multiple optical pathways between a transmitter unit and areceiver unit, wherein pairs of optical pathways form sensorinterferometers, each sensor interferometer having a sensor imbalance;an optical source in the transmitter unit for generating optical signalscomprising a sequence of optical pulses during pulse transmission timeslots that are selected from a plurality of transmission time slots withremaining transmission time slots providing dark transmission time slotswithout pulse generation, wherein each transmission time slot comprisesone of a plurality of transmission time intervals-the plurality oftransmission time intervals divided into a sequence of time-divisionmultiplexing (TDM) repetition periods-from each TDM repetition periodlocated at the same position relative to the start of each TDMrepetition period; and a modulator disposed in the transmitter unit andconfigured to modulate a phase of the optical signals between at leastone of the pulse transmission time slots and the dark transmission timeslots before the optical signals reach the optical network such thatunwanted interference signal components reaching the receiver unit aredistributed to frequency bands that do not affect a demodulated sensorsignal.
 2. The system of claim 1, wherein the unwanted interferencesignal components comprise unwanted interference between a signal of oneof the pulse transmission time slots and a signal of one of the darktransmission time slots.
 3. The system of claim 1, wherein the unwantedinterference signal components comprise unwanted interference between asignal of one of the pulse transmission time slots and a signal ofanother one of the pulse transmission time slots.
 4. The system of claim1, wherein the modulator is configured to modulate the phase of theoptical signals to provide a shift in frequency of interference betweena signal of one of the pulse transmission time slots and a signal of anyother one of the transmission time slots away from frequency bands usedfor the demodulated sensor signal.
 5. The system of claim 1, wherein themodulator is configured to modulate a phase or a frequency of theoptical pulses between TDM repetition periods to provide a shift infrequency of interference between a delayed signal of one of the TDMrepetition periods and a signal of any other one of the TDM repetitionperiods away from frequency bands used for the demodulated sensorsignal.
 6. The system of claim 1, wherein the modulator is configured tosuppress noise due to leakage light during the dark transmission timeslots.
 7. A method of interrogating sensor interferometers of an opticalnetwork comprising multiple optical pathways from a transmitter unit toa receiver unit, wherein pairs of optical pathways form the sensorinterferometers, each sensor interferometer having a sensor imbalance,the method comprising: defining a sequence of time-division multiplexing(TDM) repetition periods; producing an optical signal containing opticalpulses within a portion of a TDM repetition period, whereincorresponding optical pulses in different TDM repetition periods havethe same position relative to the start of the TDM repetition period,the remaining portion of the TDM repetition period containing leakagelight; varying a phase difference of the optical pulses betweenconsecutive TDM repetition periods at the inverse of a sub-carrierfrequency; phase modulating the optical signal such that interferencebetween the optical pulses and the leakage light will not containfrequency components in a frequency band centered at the sub-carrierfrequency; transmitting the optical signal to the optical network;receiving an interference signal generated by reflections of the opticalsignal from the sensor interferometers in the optical network; andextracting a portion of the interference signal in the frequency bandcentered at the sub-carrier frequency such that the portion of theinterference signal does not contain the frequency components due to theinterference between the optical pulses and the leakage light.
 8. Themethod of claim 7, wherein the portion of the TDM repetition period hascorresponding edges separated by a length of time equal to the sensorimbalance.